Carl Zeiss Multi-Ion-Beam Tool
Provides an enhancement to the existing helium ion microscope.
Register for free to listen to this article
Listen with Speechify
0:00
5:00
ORION NanoFab
- Based on Gas Field Ion Source (GFIS) technology
- Provides an enhancement to the existing helium ion microscope
- System is capable of providing a complete sub-10 nanometer nanofabrication and sub-nanometer imaging solution for a variety of labs
- Optional gallium focused ion beam (FIB) column can also be integrated
Carl Zeiss
www.zeiss.com/micro