Laboratory Technology

Carl Zeiss Multi-Ion-Beam Tool

Provides an enhancement to the existing helium ion microscope.

Nov 21, 2012|1 min readLab Manager

ORION NanoFab

Based on Gas Field Ion Source (GFIS) technology
Provides an enhancement to the existing helium ion microscope
System is capable of providing a complete sub-10 nanometer nanofabrication and sub-nanometer imaging solution for a variety of labs
Optional gallium focused ion beam (FIB) column can also be integrated

Carl Zeiss
www.zeiss.com/micro

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