Park Systems and NanoScientific Publications are proud to announce the 2018 NanoScientific Symposium on Scanning Probe Microscopy (SPM), a new venue for nanoscience researchers, scientists, and engineers to learn about the latest studies being formed using SPM.
Keynote speakers from both academia and industry will be on hand to talk about the current cutting-edge work being performed in their laboratories and discuss the headway they have made with SPM in some of the hottest fields and topics in nanoscience today.
To learn more about the speakers, click here.
Do not miss your chance to join this great opportunity to learn and network with some of the best and brightest in materials characterization!
- Deadline to submit abstracts
- Saturday, June 30, 2018
- Announcement of presenters
- Sunday, July 15, 2018
- Deadline to register for atomic force microscopy (AFM) short course
- Tuesday, August 28, 2018
The first day of the symposium (Wednesday, September 19) will be composed of talks and discussions covering areas such as (but not limited to):
- 2D and other nanomaterials
- Polymers and composites
- Electronics, magnetics, and photonics
- Sustainable energy applications
- Semiconductor and MEMS process and fabrication
- Analytical chemistry
- Biology, biomedicine, and other life sciences
The second day of the symposium (Thursday, September 20) will focus on a short course for AFM with access to live AFM systems at Park Nanoscience Center.
Attendees who wish to demonstrate their work in the form of an oral or poster presentation are encouraged to submit their abstracts by Saturday, June 30th to email@example.com
Please note the following guidelines when preparing your submission:
- Each registrant is limited to one oral presentation
- Indicate the type of Park SPM system that was utilized in the study. If an in-house SPM was used, please indicate the year in which it was developed.
- Abstracts are to include at least 400 words and must include at least one figure featuring representative SPM imagery or spectroscopy data.
- Submissions should include the names and affiliations of all authors.