Laser scanning confocal microscopes like the Olympus LEXT OLS5000 system help to quantify surface geometry of a sample, such as surface roughness, depth, and height measurements. This type of microscopy inspection has become increasingly popular in manufacturing production lines for its ability to make non-destructive measurements to acquire a high-resolution 3D image in a few seconds.
Precise ImagingWith the capability to make accurate 3D measurements on a wide range of sample types, the OLS5000 system delivers reliable data for quality assurance and process control. Its 405nm violet laser and dedicated high-NA objectives make it possible to capture fine patterns and defects that many conventional microscopes cannot detect.
Non-Destructive, Fast ResultsThe microscope’s high-speed scanning algorithm delivers improved data quality andfaster speeds to reduce scan time and provide better productivity. Additionally, when measuring the shape of steps on a sample containing near-vertical planes, such as an electronic component or microelectromechanical system (MEMS), the data acquisition time can be reduced by limiting the Z-direction scanning range.
Longer Working Distance for Larger SamplesSamples up to a height of 210 mm or concavities as deep as 25 mm can be measured using the OLS5000 laser confocal microscope. Additionally, Olympus’ line of 10X to 100X objective lenses enables you to choose the one best suited to your current sample.
Pattern Recognition and Alignment Measurement Software EnhancementOlympus’ new software feature, Pattern Recognition and Alignment Measurement (PRAM), enables you to set up semi-automatic measurements at the click of a button. For repetitive measurements, this new feature helps reduce human error and shorten measurement time for improved inspection efficiency
Easy to OperateOlympus’ new software feature, Pattern Recognition and Alignment Measurement (PRAM), enables you to set up semi-automatic measurements at the click of a button. For repetitive measurements, this new feature helps reduce human error and shorten measurement time for improved inspection efficiency.