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Raman Microspectroscopy, Colorimetry, and Intensity Mapping of Large Displays

Novel solution from CRAIC Technologies provides microscopic spatial resolution

CRAIC 20/30 XL™ UV-visible-NIR microspectrophotometer
  • Able to take spectra and images of microscopic features of large flat panel displays
  • With the ability to measure micron-sized features, the 20/30 XL™ is able to measure color and intensity of even individual pixels
  • Makes high spatial resolution color and intensity mapping possible for the largest displays  
by CRAIC Technologies
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SAN DIMAS, CA — September 1, 2020 — CRAIC Technologies, the world’s leading innovator of UV-visible-NIR microspectroscopy solutions, is proud to introduce the 20/30 XL™ UV-visible-NIR microspectrophotometer. The 20/30 XL™ microspectrophotometer is designed to non-destructively analyze microscopic features of very large flat panel displays by incorporating large scale sample handling.  With a spectral range from the deep ultraviolet to the near infrared, analysis of samples can be done by absorbance, reflectance, Raman, luminescence, and fluorescence with unparalleled speed and accuracy. The system can also be configured to image microscopic samples in the UV and NIR regions in addition to high resolution color imaging.  Due to its flexible design which gives it the ability to analyze the largest displays, applications are numerous and include mapping color and intensity variations, film thickness measurements, and even scanning the surfaces of display components for defects.  With the ability to analyze the spectra and to image microscopic features of very large devices, the 20/30 XL™ microspectrophotometer is the cutting-edge micro-analysis tool for laboratories and manufacturing facilities.

“CRAIC Technologies has been an innovator in the field of UV-visible-NIR microanalysis since its founding. We have helped to advance the field of microscale analysis with innovative instrumentation, software, research and teaching. The 20/30 XL™ microspectrophotometer was born out of demand from our industrial customers to be able to analyze microscopic features of very large flat panel displays,” states Dr. Paul Martin, president of CRAIC Technologies. “As such, we have listened to our customers and created the 20/30 XL,™ a system backed by years of experience in designing, building, and...using of this type of instrumentation for spectroscopic and image analysis.” 

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The 20/30 XL™ microspectrophotometer integrates an advanced CRAIC Technologies Lightblades™ spectrophotometers with a sophisticated UV-visible-NIR range microscope optics and powerful, easy-to-use Lambdafire™ software.  This flexible instrument is designed to attach to large sample handling frames so that even the largest displays may be analyzed.  It is able to acquire data from microscopic features of very large samples by absorbance, reflectance, and several types of luminescence spectroscopy, in addition to microcolorimetry, film thickness measurements, Raman microspectroscopy, and even imaging in the UV, visible, and NIR regions.   Sophisticated software, calibrated variable apertures, and other innovations all point to a new level of sophistication for microanalysis with the 20/30 XL™.   With high sensitivity, durable design, ease-of-use, multiple imaging and spectroscopic techniques, automation, and the support of CRAIC Technologies, the 20/30 XL™ is more than just a quality control measurement tool…it is the solution to your analytical challenges. 

For more information on the 20/30 XL™ microspectrophotometer and its usage for development and quality control of flat panel displays, visit

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CRAIC Technologies

948 N. Amelia Ave. San Dimas, CA, US 91773