S.I.S. Surface Imaging Systems GmbH develops, manufactures and distributes advanced atomic force/scanning probe microscopy systems (AFM/SPM) for numerous applications in materials research, including semiconductors, data storage, electronic materials, solar cells, polymers and catalysts. AFM/SPM is a well-established method for ultra-high spatial resolution surface imaging and the characterization of surfaces down to atomic dimensions.  

 

S.I.S. offers a product range from bench-top high-performance AFM-only microscopes to integrated high-end AFM/optical microscopy (OM) combinations, all the way to large floor-standing AFM/OM combination instruments for the characterization of 300mm wafers in a clean room environment. The S.I.S. core technology includes extremely compact AFM/SPM subunits which can be integrated easily with other analytical instruments such as optical microscopes, Raman microscopes or micro-hardness testers.

 

After the acquisition, S.I.S. will be renamed “Bruker Nano GmbH”.  

 

Source: Bruker AXS