Physical Sciences

Ultrafast Imaging of Complex Systems in 3-D at Near Atomic Resolution Becoming Increasingly Possible
It is becoming possible to image complex systems in 3-D with near-atomic resolution on ultrafast timescales using extremely intense X-ray free-electron laser (XFEL) pulses.

Scientists at the Department of Energy’s Oak Ridge National Laboratory have used advanced microscopy to carve out nanoscale designs on the surface of a new class of ionic polymer materials for the first time. The study provides new evidence that atomic force microscopy, or AFM, could be used to precisely fabricate materials needed for increasingly smaller devices.

Ever wondered how Santa gets around the whole world in one night? Why no one sees him delivering presents? How he fits down the chimney? Or how Rudolph's nose came to glow?

















