Labmanager Logo
Computer image of new technology in the AMBER 2

TESCAN

Leveraging an AI-driven approach and an extensive material library, AMBER 2 ensures reliable, fully automated sample preparation across a wide range of materials.

Next Generation Gallium FIB-SEM

TESCAN debuts the AMBER 2 at M&M 2024

| 2 min read
Share this Article
Register for free to listen to this article
Listen with Speechify
0:00
2:00

TESCAN, a leading provider of scientific instrumentation, announces the launch of the TESCAN AMBER 2, the fourth generation of the TESCAN gallium FIB-SEM platform and the successor to the current AMBER generation, at the Microscopy & Microanalysis (M&M) Expo 2024.

Alongside AMBER 2, TESCAN is also unveiling two new integrated innovative tools: AURA Gentle Ion Beam system, for minimizing gallium FIB induced damage in TEM specimen preparation, and TEM AutoPrep ProTM software, for automating and optimizing the entire TEM sample preparation process.

Lab manager academy logo

Get training in Asset Management and earn CEUs.

One of over 25 IACET-accredited courses in the Academy.

Certification logo

Asset Management course

Introducing AMBER 2: Perfecting TEM/STEM Sample Preparation and Nanoprototyping

The original TESCAN AMBER, introduced in 2019, set new standards in materials nanocharacterization with its ultra-high-resolution SEM and advanced Ga+ FIB.  

AMBER 2 builds on this legacy with enhanced automation and usability, ensuring precise and efficient sample preparation and 3D analysis.

By streamlining operations with fully automated functions, AMBER 2 reduces complexity for all users. Its advanced automation capabilities allow for routine sample preparation and overnight usage, significantly boosting lab productivity. The system also enhances materials surface characterization with an improved detection system and expands capabilities for prototyping applications such as electron beam lithography.

Newly Enhanced Features of TESCAN AMBER 2

Leveraging an AI-driven approach and an extensive material library, AMBER 2 ensures reliable, fully automated sample preparation across a wide range of materials. Additionally, the integration of a beam blanker on the new generation BrightBeam™ SEM column facilitates effective nanoprototyping through electron beam lithography. AMBER 2 also serves as an excellent entry point for those looking to perform FIB-SEM characterization from micron scale to the nanoscale.

Key Features of TESCAN AMBER 2

  • Enhanced Automation: Fully automated processes minimize user intervention and maximize efficiency. 
  • User-Friendly Interface: Intuitive design for both beginners and advanced users. 
  • Overnight Operation: Performs automated tasks overnight, increasing lab productivity. 
  • Precise Sample Preparation: Maintains high resolution and accuracy in sample preparation and imaging. 
  • Optimized Prototyping: Expands possibilities for prototyping techniques. 
Loading Next Article...
Loading Next Article...

CURRENT ISSUE - September 2024

The Power of Soft Skills

Transforming lab culture through effective communication and leadership

Lab Manager September 2024 Cover Image
Lab Manager Analytical eNewsletter

Stay Connected with Analytical News

Click below to subscribe to Analytical Tools & Techniques eNewsletter!

Subscribe Today