Computer image of new technology in the AMBER 2

Next Generation Gallium FIB-SEM

TESCAN debuts the AMBER 2 at M&M 2024

Written byTESCAN
Updated | 2 min read
Register for free to listen to this article
Listen with Speechify
0:00
2:00

TESCAN, a leading provider of scientific instrumentation, announces the launch of the TESCAN AMBER 2, the fourth generation of the TESCAN gallium FIB-SEM platform and the successor to the current AMBER generation, at the Microscopy & Microanalysis (M&M) Expo 2024.

Alongside AMBER 2, TESCAN is also unveiling two new integrated innovative tools: AURA Gentle Ion Beam system, for minimizing gallium FIB induced damage in TEM specimen preparation, and TEM AutoPrep ProTM software, for automating and optimizing the entire TEM sample preparation process.

lab design news logo

Interested in lab design?

Sign up for the free Lab Design Newsletter from our sister site, Lab Design News.

Is the form not loading? If you use an ad blocker or browser privacy features, try turning them off and refresh the page.

By completing this form, you agree to receive news updates and relevant promotional content from Lab Design News. You may unsubscribe at any time. View our Privacy Policy

Introducing AMBER 2: Perfecting TEM/STEM Sample Preparation and Nanoprototyping

The original TESCAN AMBER, introduced in 2019, set new standards in materials nanocharacterization with its ultra-high-resolution SEM and advanced Ga+ FIB.  

AMBER 2 builds on this legacy with enhanced automation and usability, ensuring precise and efficient sample preparation and 3D analysis.

By streamlining operations with fully automated functions, AMBER 2 reduces complexity for all users. Its advanced automation capabilities allow for routine sample preparation and overnight usage, significantly boosting lab productivity. The system also enhances materials surface characterization with an improved detection system and expands capabilities for prototyping applications such as electron beam lithography.

Newly Enhanced Features of TESCAN AMBER 2

Leveraging an AI-driven approach and an extensive material library, AMBER 2 ensures reliable, fully automated sample preparation across a wide range of materials. Additionally, the integration of a beam blanker on the new generation BrightBeam™ SEM column facilitates effective nanoprototyping through electron beam lithography. AMBER 2 also serves as an excellent entry point for those looking to perform FIB-SEM characterization from micron scale to the nanoscale.

Key Features of TESCAN AMBER 2

  • Enhanced Automation: Fully automated processes minimize user intervention and maximize efficiency. 
  • User-Friendly Interface: Intuitive design for both beginners and advanced users. 
  • Overnight Operation: Performs automated tasks overnight, increasing lab productivity. 
  • Precise Sample Preparation: Maintains high resolution and accuracy in sample preparation and imaging. 
  • Optimized Prototyping: Expands possibilities for prototyping techniques. 

Related Topics

Loading Next Article...
Loading Next Article...

CURRENT ISSUE - May/June 2025

The Benefits, Business Case, And Planning Strategies Behind Lab Digitalization

Joining Processes And Software For a Streamlined, Quality-First Laboratory

Lab Manager May/June 2025 Cover Image