Faster, More Accurate Analysis for Flexible Solar Cells and Thin Films
Hiden Analytical has introduced a significant upgrade to its SIMS Workstation series with the release of the Dual Polarity Simultaneous Detector. This innovation offers faster and more accurate surface analysis by allowing the detection of both positive and negative ions in a single run.
Secondary Ion Mass Spectrometry (SIMS) is widely used in industries like semiconductors, glass coatings, and thin-film deposition, where precision and sensitivity are critical. Traditionally, SIMS requires two separate measurements to analyze both ion polarities. Hiden Analytical’s new technology eliminates that redundancy.
Enhanced Insight for Complex Samples
In the analysis of intricate materials such as CIGS flexible solar cells, this development offers notable benefits:
- Simultaneous detection of positive and negative ions
- Reduced total analysis time
- Improved data accuracy
- Greater insight for failure analysis
Dr. Graham Cooke, Principal Scientist at Hiden Analytical, noted, “this really is a game-changing development for thin film measurement and puts SIMS, and Hiden, at the forefront of cost-effective materials analysis.”
Lab managers working with advanced materials stand to gain significant efficiencies with this new dual polarity approach.
Learn more at Hiden Analytical or contact info@hiden.co.uk.
