News

Scientists at the Department of Energy’s Oak Ridge National Laboratory have used advanced microscopy to carve out nanoscale designs on the surface of a new class of ionic polymer materials for the first time. The study provides new evidence that atomic force microscopy, or AFM, could be used to precisely fabricate materials needed for increasingly smaller devices.
| 2 min read

Sandia National Laboratories is tackling one of the biggest barriers to the use of robots in emergency response: energy efficiency.
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