New Form of Electron-Beam Imaging Can See Elements That Are 'Invisible' to Common Methods

Berkeley Lab-pioneered ‘MIDI-STEM’ produces high-resolution views of lightweight atoms.

Written byLawrence Berkeley National Laboratory
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Electrons can extend our view of microscopic objects well beyond what’s possible with visible light—all the way to the atomic scale. A popular method in electron microscopy for looking at tough, resilient materials in atomic detail is called STEM, or scanning transmission electron microscopy, but the highly focused beam of electrons used in STEM can also easily destroy delicate samples.

This is why using electrons to image biological or other organic compounds, such as chemical mixes that include lithium—a light metal that is a popular element in next-generation battery research—requires a very low electron dose.

Scientists at the Department of Energy’s Lawrence Berkeley National Laboratory (Berkeley Lab) have developed a new imaging technique, tested on samples of nanoscale gold and carbon, that greatly improves images of light elements using fewer electrons.

The newly demonstrated technique, dubbed MIDI-STEM, for matched illumination and detector interferometry STEM, combines STEM with an optical device called a phase plate that modifies the alternating peak-to-trough, wave-like properties (called the phase) of the electron beam.

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