TESCAN, in collaboration with Orsay Physics, has launched the AMBER X 2, a revolutionary plasma FIB-SEM system poised to elevate materials science research. This cutting-edge technology offers unparalleled resolution, throughput, and versatility for advanced sample preparation and characterization, setting new industry benchmarks.
AMBER X 2, backed by Orsay Physics' plasma FIB-SEM expertise, is designed for materials science applications with features like fully automated TEM/STEM specimen preparation and enhanced milling efficiency. It also boasts improved FIB optical parameters, a field-free SEM column, and multimodal/multiscale analysis capabilities—delivering an all-in-one solution for researchers.
Key features include the MISTRAL Plasma FIB Column™, which enhances beam profiles and precision, and the TEM AutoPrep Pro™ for automated TEM sample preparation. The field-free UHR-SEM column offers high-resolution imaging and wide-field scanning, while multimodal analysis supports next-gen battery research through 3D methods like 3D ToF-SIMS.
Martin Slama, Product Marketing Manager, describes the AMBER X 2 as a groundbreaking tool that redefines the capabilities of FIB-SEMs in materials science, offering superior characterization and TEM automation.
This article is a summary of a published press release provided by TESCAN
