How SEM/EDS Works and Its Applications in Materials Science
This versatile technique offers insight into the structure and composition of a range of materials
scanning electron microscopes
First 4D-Scanning Transmission Electron Microscope
Built from the ground up for multimodal nano-characterization
Electron Microscope Price, including Cost of 50 Different Models
A comprehensive guide to electron microscope models, prices, and cost considerations
New Scanning Electron Microscope with 'Simple SEM' Automation, 3D Analysis
New microscope especially suited for repetitive operations and quality control
FIB-SEM: A Versatile Nanoscale Laboratory Tool for Advanced Material Science
Achieve a new level of 3D analysis through multi-modal characterization
Microscopy
What to think about when choosing a microscope for your lab
TESCAN's New MultiVac Module Adds Conventional Low Vacuum and Variable Pressure Capabilities to TESCAN SEMs
MultiVac improves efficiency for topographic characterization of non-conductive, beam-sensitive, or outgassing samples when using low keV imaging
Thermo Scientific Spectra Ultra Offers a Leap Forward for Advanced Materials Characterization
All-in-one (S)TEM enables the understanding of complex samples for materials scientists and semiconductor manufacturers
ZEISS Enhances its Field Emission SEMs for Highest Demands in Sub-Nanometer Imaging, Analytics, and Sample Flexibility
The new ZEISS GeminiSEM family delivers more information from any sample, minimizes sample damage, and prevents sample artifacts
A Picture is Worth a Thousand Words: Microscopy Solutions
Join Lab Manager and our panel of experts as we discuss available microscope technology and how to choose the best tool for your lab