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scanning electron microscopes
scanning electron microscopes
Press Release
A 2,400,000 cps EDS Detector for SEM Users from Bruker
by
Sharon Dong
Bruker's four-channel SDD architecture redefines speed and light-element sensitivity for SEM elemental mapping
| 4 min read
Article
Beyond the Instrument: Advanced Materials Characterization as a Capability Decision
by
Jordan Willis, BSc
| 5+ min read
Article
Particle Analysis in Gunshot Residue Testing
by
Craig Bradley
| 5 min read
Article
Managing Electron Microscope Safety in the Lab
by
Michelle Gaulin
High-voltage and radiation hazards make electron microscope safety a critical responsibility for lab managers
| 2 min read
Resource Guide
Innovations and Challenges in Industrial Microscopy
by
Lab Manager
Expert insights and best practices for advanced imaging, sample preparation, and analytical excellence
Updated
| 1 min read
Product News
Next Generation Plasma FIB-SEM
by
TESCAN
AMBER X 2 delivers advancements in plasma FIB technology to further close the performance gap between Ga FIB and plasma FIB
| 1 min read
News
Reimagining Electron Microscopy
by
University of Illinois Grainger College of Engineering
Bringing high-end resolution to lower-cost microscopes
| 4 min read
Article
Advancements in Scanning Electron Microscopes
by
Michael Beh, PhD
Explore the latest developments in electron microscopes, including improvements in detectors, sample holders, and software for enhanced usability and data quality
| 2 min read
Purchasing Guide
Purchasing Guide: Microscopy
by
Lab Manager
Microscopes are a staple in labs of all kinds
| 2 min read
Product Focus
How SEM/EDS Works and Its Applications in Materials Science
by
Aimee Cichocki
This versatile technique offers insight into the structure and composition of a range of materials
| 4 min read
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