ORNL Microscopy Pencils Patterns in Polymers at the Nanoscale

Scientists at the Department of Energy’s Oak Ridge National Laboratory have used advanced microscopy to carve out nanoscale designs on the surface of a new class of ionic polymer materials for the first time. The study provides new evidence that atomic force microscopy, or AFM, could be used to precisely fabricate materials needed for increasingly smaller devices.

Written byOak Ridge National Laboratory
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Polymerized ionic liquids have potential applications in technologies such as lithium batteries, transistors and solar cells because of their high ionic conductivity and unique structure. But many aspects of the recently discovered materials are still not well understood.

When ORNL researchers used an atomic force microscope to begin characterizing the properties of polymerized ionic liquid thin films, the experiment yielded some surprising results.

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