Tailored AFM Probes Created Via 3-D Direct Laser Writing

A group of Karlsruhe Institute of Technology researchers in Germany report using 3-D direct laser writing based on two-photon polymerization as a tool to fabricate custom-made probes for atomic force microscopy (AFM).

Written byAmerican Institute of Physics
| 3 min read
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(Washington, D.C.)—Atomic force microscopy (AFM) is a technique that allows researchers to analyze surfaces at the atomic scale, and it’s based on a surprisingly simple concept: A sharp tip on a cantilever “senses” the topography of samples.

While this technique has been successfully used for more than 30 years, and you can easily buy standard micromachined probes for experiments, standard-sized tips aren’t always exactly what you need. Researchers frequently desire tips with a unique design—a specific tip apex shape or extremely long tips that can reach the bottom of deep trenches. Preparing nonstandard tips via micromachining is possible, but it’s often expensive.

Related Article: Advanced Light Source Sets Microscopy Record

But now, a group of Karlsruhe Institute of Technology (KIT) researchers report that they have developed a method to tailor tips for specific applications via 3-D direct laser writing based on two-photon polymerization that will be appearing on the cover this week in Applied Physics Letters, from AIP Publishing.

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