INSIGHTS on Microscopy & Imaging: Probe-based Techniques

Tunneling into topography

Written byAngelo DePalma, PhD
| 3 min read
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In contrast to radiation-based optical and electron microscopy, scanning probe microscopy (SPM) employs an atomically fine mechanical probe that scans across a surface and moves along the z-axis under the influence of weak atomic forces on the sample or the tunneling force of electrons emitted from the tip. The two main scanning probe techniques are atomic force microscopy (AFM) and scanning tunneling microscopy (STM). Both have many variants, but all share the common characteristic of creating a 3-D surface map based on topography, electrical modulus, elasticity modulus, contact, strain, density, and many others.

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