Microscopy

With the cost of an upper echelon field emission scanning electron microscope approaching $1 million, a pre-owned SEM becomes a cost-effective possibility. But before purchasing any SEM, new or used, a couple of questions need to be answered.
| 5+ min read

This August, JEOL USA will demonstrate the first correlative microscope to enable concurrent light microscopy and atmospheric scanning electron microscopy (ASEM) for observation of and experimentation on samples in their native state. The new JEOL ClairScope will make its debut in the United States at Microscopy & Microanalysis (M&M) in Portland, Oregon August 2-5, 2010, just prior to installation at Northwestern Universitys Biological Imaging Facility where it will be used for demonstrations and applications development.
| 2 min read

JEOL USA and the University of Texas at Dallas (UTD) jointly announced in March the Universitys acquisition of the new JEOL atomic resolution Transmission Electron Microscope (TEM). The new ARM200F is an aberration-corrected TEM that achieves better than 1 Angstrom resolution in STEM and TEM and chemical analysis at the atomic level.
| 2 min read







