Analytical Instruments

JEOL USA and the University of Texas at Dallas (UTD) jointly announced in March the Universitys acquisition of the new JEOL atomic resolution Transmission Electron Microscope (TEM). The new ARM200F is an aberration-corrected TEM that achieves better than 1 Angstrom resolution in STEM and TEM and chemical analysis at the atomic level.
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Nikon Corporation announced that it will sign an agreement with the Univ. of California, San Francisco Office of Technology Management for Structured Illumination Microscopy (SIM) technology. Under the terms of the agreement, UCSF will license its technology to Nikon to make N-SIM enabled microscopes.
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