JAIST Researchers Use Deep Learning to Unlock X-ray Diffraction Secrets
Deep learning can help in characterizing materials by analyzing peak changes in x-ray diffractions
XRD / XRF
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Bruker and DECTRIS Announce the Integration of the New EIGER2 R 250K Detector into the D8™ X-ray Diffraction Systems
The new EIGER2 R 250K with over 250,000 pixels incorporates the latest technological enhancements applied to the entire EIGER2 R family
Rigaku Launches New Tube-Below WDXRF Spectrometer
The new ZSX Primus IVi WDXRF spectrometer is especially suited for X-ray analysis of liquids, alloys, and plated metals
